Showing results: 46 - 60 of 336 items found.
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58604 -
Chroma ATE Inc.
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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3680 -
Chroma ATE Inc.
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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3650 -
Chroma ATE Inc.
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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3650-EX -
Chroma ATE Inc.
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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PXIe-6943 -
Astronics Corporation
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Astronics Corporation
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Astronics Corporation
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Astronics Corporation
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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E9902G -
Keysight Technologies
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Peritec Corp.
Peritec is accredited by the "RF and Wireless Specialty" (radio expertise and RF) from National Instruments (NI).The RF and Wireless Specialty, NI Alliance partners with expertise specialized design of radio frequency / wireless, authentication, automatic test, the high-frequency measurement is certified. Based on the track record and a wealth of expertise, Peritec, offers test solutions for RF / Wireless system.
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MICRONIX
The necessity of a wireless system test has risen by the spread of recent wireless telecommunication equipment as shown in cellular phone, wireless LAN, RF-ID tag and ETC (Electronic Toll Collection system). It is necessary for a wireless test to be performed in anechoic environment in which an external noise is intercepted and a radio wave does not reflect internally. An anechoic chamber (room version of a shield box) is proper facilities but needs a wide space and a huge cost. Especially, the equipment under wireless system test on the production line can not radiate any signal radio wave outside before approval. The shield box satisfies these conditions.
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MiNi-HAC -
APREL, Inc.
Hearing Aid Compatibility (HAC) evaluation of wireless handsets ensures accessibility of these technologies to the hearing impaired. The MiNi-HAC system can be used for the design and development of wireless handsets as well as for evaluation of hearing aids used by the hearing impaired to gain access to mobile wireless technologies. RF Emissions Test - near field measurements of the electric and magnetic fields emitted by a wireless device.
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Frontline X500 -
Teledyne LeCroy
The Frontline X500 Wireless Protocol Analyzer is a powerful one-box test solution for wireless product developers that captures information streaming between devices enabled with Bluetooth, Wi-Fi, and 802.15.4 technologies.
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Silent Solutions LLC
As wireless continues to be a significant growth opportunity, SILENT works with commercial and industrial manufacturers to ensure time-to-market for RF and wireless enabled products. We design, build, and test RF and wireless solutions - within budget and cost guidelines - for consumer grade products and high performance circuits and systems.